BWT-4902

Raman Analysis of Si Crytallinity

Summary

Raman spectroscopy at 532 nm excitation is used to study the crystalline and amorphous content of mixed phase silicon films.

Download BWT-4902 (EN)

Contact

Metrohm AG

Ionenstrasse
9100 Herisau

Contact

Find Applications

Refine your search(433)

This application has been tagged under

// Chemical

Near-infrared and Raman spectroscopy for polymer analysis: An introduction

// Chemical // Moisture water // Spectroscopy (NIRS Raman)

Water content in propylene glycol monomethyl ether (PGME)

// Chemical // Moisture water // Solvents

Cation quantification with increased performance using microbore IC

// Chemical // Ion chromatography // Standard solutions

OMNIS NIRS: An efficiency boost for your laboratory

// Chemical // Spectroscopy (NIRS Raman) // Pharmaceutical

2 / 4